Abstract
The continuous health monitoring of PV modules is mandatory to maintain their high efficiency and minimize power losses due to faults or failures. In this work, a low-cost embedded tracer is developed to measure the I−V curve of a PV module in less than 0.2 s. The data are used to extract the five parameters of the single-diode model and its main characteristics (open-circuit voltage, short-circuit current, and maximum power). Experimental data are used to validate the analytical model and evaluate the two fault diagnosis methods, using as fault features the parameters of the single-diode model or the main characteristics of the I−V curve. The results, based on field data under different temperatures and irradiances, show that the degradation of series and shunt resistances could be detected more accurately with the main characteristics rather than with the parameters. However, the estimated parameters could still be used to monitor the long-term degradation effects.