LAPSE:2018.0306
Published Article
LAPSE:2018.0306
A Throughput Management System for Semiconductor Wafer Fabrication Facilities: Design, Systems and Implementation
Liam Y. Hsieh, Tsung-Ju Hsieh
July 31, 2018
Abstract
Equipment throughput is one of the most critical parameters for production planning and scheduling, which is often derived by optimization techniques to achieve business goals. However, in semiconductor manufacturing, up-to-date and reliable equipment throughput is not easy to estimate and maintain because of the high complexity and extreme amount of data in the production systems. This article concerns the development and implementation of a throughput management system tailored for a semiconductor wafer fabrication plant (Fab). A brief overview of the semiconductor manufacturing and an introduction of the case Fab are presented first. Then, we focus on the system architecture and some concepts of crucial modules. This study also describes the project timescales and difficulties and discusses both tangible and intangible benefits from this project.
Keywords
capacity management, data analysis, semiconductor manufacturing, wafer per hour (WPH)
Suggested Citation
Hsieh LY, Hsieh TJ. A Throughput Management System for Semiconductor Wafer Fabrication Facilities: Design, Systems and Implementation. (2018). LAPSE:2018.0306
Author Affiliations
Hsieh LY: Department of Systems Engineering and Operations Research, George Mason University, Fairfax, VA 22030, USA [ORCID]
Hsieh TJ: GiantSoft, Hsinchu 300, Taiwan
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Journal Name
Processes
Volume
6
Issue
2
Article Number
E16
Year
2018
Publication Date
2018-02-11
ISSN
2227-9717
Version Comments
Original Submission
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PII: pr6020016, Publication Type: Journal Article
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LAPSE:2018.0306
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https://doi.org/10.3390/pr6020016
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