LAPSE:2020.0608
Published Article
LAPSE:2020.0608
Stacked Auto-Encoder Based CNC Tool Diagnosis Using Discrete Wavelet Transform Feature Extraction
Jonggeun Kim, Hansoo Lee, Jeong Woo Jeon, Jong Moon Kim, Hyeon Uk Lee, Sungshin Kim
June 23, 2020
Machining processes are critical and widely used components in the manufacturing industry because they help to precisely make products and reduce production time. To keep the previous advantages, a machine tool should be installed at the designated place and condition of the machine tool should be maintained appropriately to working environment. In various maintenance methods for keeping the condition of machine tool, condition-based maintenance can be robust to unpredicted accidents and reduce maintenance costs. Tool monitoring and diagnosis are some of the most important components of the condition based maintenance. This paper proposes stacked auto-encoder based CNC machine tool diagnosis using discrete wavelet transform feature extraction to diagnose a machine tool. The diagnosis model, which only uses cutting force data, cannot sufficiently reflects tool condition. Hence, we modeled diagnosis model using features extracted from a cutting force, a current signal, and coefficients of the discrete wavelet transform. The experimental results showed that the model which uses feature data has better performance than the model that uses only cutting force data. The feature based models are lower false negative rate (FNR) and false positive rate. Moreover, squared prediction error using normalized residual vector also reduced FNR because normalization reduces weight bias.
Keywords
auto-encoder, condition based maintenance, discrete wavelet transform, feature extraction, tool diagnosis
Suggested Citation
Kim J, Lee H, Jeon JW, Kim JM, Lee HU, Kim S. Stacked Auto-Encoder Based CNC Tool Diagnosis Using Discrete Wavelet Transform Feature Extraction. (2020). LAPSE:2020.0608
Author Affiliations
Kim J: Department of Electrical and Computer Engineering, Pusan National University, Busan 46241, Korea [ORCID]
Lee H: Department of Electrical and Computer Engineering, Pusan National University, Busan 46241, Korea [ORCID]
Jeon JW: 12, Bulmosan-ro 10beon-gil, Seongsan-gu, Changwon-si, Gyeongsangnam-do 51543, Korea
Kim JM: 12, Bulmosan-ro 10beon-gil, Seongsan-gu, Changwon-si, Gyeongsangnam-do 51543, Korea
Lee HU: 12, Bulmosan-ro 10beon-gil, Seongsan-gu, Changwon-si, Gyeongsangnam-do 51543, Korea
Kim S: Department of Electrical and Computer Engineering, Pusan National University, Busan 46241, Korea [ORCID]
Journal Name
Processes
Volume
8
Issue
4
Article Number
E456
Year
2020
Publication Date
2020-04-12
Published Version
ISSN
2227-9717
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Original Submission
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PII: pr8040456, Publication Type: Journal Article
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LAPSE:2020.0608
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doi:10.3390/pr8040456
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Jun 23, 2020
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CC BY 4.0
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Jun 23, 2020
 
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Jun 23, 2020
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https://psecommunity.org/LAPSE:2020.0608
 
Original Submitter
Calvin Tsay
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