LAPSE:2023.30954
Published Article

LAPSE:2023.30954
Nanostructured Thermoelectric PbTe Thin Films with Ag Addition Deposited by Femtosecond Pulsed Laser Ablation
April 17, 2023
Abstract
Pulsed laser deposition operated by an ultra-short laser beam was used to grow in a vacuum and at room temperature natively nanostructured thin films of lead telluride (PbTe) for thermoelectric applications. Different percentages of silver (Ag), from 0.5 to 20% of nominal concentration, were added to PbTe deposited on polished technical alumina substrates using a multi-target system. The surface morphology and chemical composition were analyzed by Scanning Electron Microscope and X-ray Photoelectron Spectroscopy, whereas the structural characteristics were investigated by X-ray Diffraction. Electrical resistivity as a function of the sample temperature was measured by the four-point probe method by highlighting a typical semiconducting behavior, apart from the sample with the maximum Ag concentration acting as a degenerate semiconductor, whereas the Seebeck coefficient measurements indicate n-type doping for all the samples. The power factor values (up to 14.9 µW cm−1 K−2 at 540 K for the nominal 10% Ag concentration sample) are competitive for low-power applications on flexible substrates, also presuming the achievement of a large reduction in the thermal conductivity thanks to the native nanostructuring.
Pulsed laser deposition operated by an ultra-short laser beam was used to grow in a vacuum and at room temperature natively nanostructured thin films of lead telluride (PbTe) for thermoelectric applications. Different percentages of silver (Ag), from 0.5 to 20% of nominal concentration, were added to PbTe deposited on polished technical alumina substrates using a multi-target system. The surface morphology and chemical composition were analyzed by Scanning Electron Microscope and X-ray Photoelectron Spectroscopy, whereas the structural characteristics were investigated by X-ray Diffraction. Electrical resistivity as a function of the sample temperature was measured by the four-point probe method by highlighting a typical semiconducting behavior, apart from the sample with the maximum Ag concentration acting as a degenerate semiconductor, whereas the Seebeck coefficient measurements indicate n-type doping for all the samples. The power factor values (up to 14.9 µW cm−1 K−2 at 540 K for the nominal 10% Ag concentration sample) are competitive for low-power applications on flexible substrates, also presuming the achievement of a large reduction in the thermal conductivity thanks to the native nanostructuring.
Record ID
Keywords
lead telluride, nanostructuring, pulsed fs-laser deposition, thermoelectric properties
Subject
Suggested Citation
Bellucci A, Orlando S, Medici L, Lettino A, Mezzi A, Kaciulis S, Trucchi DM. Nanostructured Thermoelectric PbTe Thin Films with Ag Addition Deposited by Femtosecond Pulsed Laser Ablation. (2023). LAPSE:2023.30954
Author Affiliations
Bellucci A: Istituto di Struttura della Materia (ISM)—Sez. Montelibretti, DiaTHEMA Laboratory, Consiglio Nazionale delle Ricerche, Via Salaria km 29.300, 00015 Monterotondo, Italy [ORCID]
Orlando S: Istituto di Struttura della Materia (ISM)—Sez. Tito Scalo, FemtoLab, Consiglio Nazionale delle Ricerche, Zona Industriale, 85050 Tito, Italy
Medici L: Istituto di Metodologie per l’Analisi Ambientale (IMAA), Consiglio Nazionale delle Ricerche, Zona Industriale, 85050 Tito, Italy
Lettino A: Istituto di Metodologie per l’Analisi Ambientale (IMAA), Consiglio Nazionale delle Ricerche, Zona Industriale, 85050 Tito, Italy
Mezzi A: Istituto per lo Studio dei Materiali Nanostrutturati (ISMN)—Sez. Montelibretti, Consiglio Nazionale delle Ricerche, Via Salaria km 29.300, 00015 Monterotondo, Italy [ORCID]
Kaciulis S: Istituto per lo Studio dei Materiali Nanostrutturati (ISMN)—Sez. Montelibretti, Consiglio Nazionale delle Ricerche, Via Salaria km 29.300, 00015 Monterotondo, Italy [ORCID]
Trucchi DM: Istituto di Struttura della Materia (ISM)—Sez. Montelibretti, DiaTHEMA Laboratory, Consiglio Nazionale delle Ricerche, Via Salaria km 29.300, 00015 Monterotondo, Italy [ORCID]
Orlando S: Istituto di Struttura della Materia (ISM)—Sez. Tito Scalo, FemtoLab, Consiglio Nazionale delle Ricerche, Zona Industriale, 85050 Tito, Italy
Medici L: Istituto di Metodologie per l’Analisi Ambientale (IMAA), Consiglio Nazionale delle Ricerche, Zona Industriale, 85050 Tito, Italy
Lettino A: Istituto di Metodologie per l’Analisi Ambientale (IMAA), Consiglio Nazionale delle Ricerche, Zona Industriale, 85050 Tito, Italy
Mezzi A: Istituto per lo Studio dei Materiali Nanostrutturati (ISMN)—Sez. Montelibretti, Consiglio Nazionale delle Ricerche, Via Salaria km 29.300, 00015 Monterotondo, Italy [ORCID]
Kaciulis S: Istituto per lo Studio dei Materiali Nanostrutturati (ISMN)—Sez. Montelibretti, Consiglio Nazionale delle Ricerche, Via Salaria km 29.300, 00015 Monterotondo, Italy [ORCID]
Trucchi DM: Istituto di Struttura della Materia (ISM)—Sez. Montelibretti, DiaTHEMA Laboratory, Consiglio Nazionale delle Ricerche, Via Salaria km 29.300, 00015 Monterotondo, Italy [ORCID]
Journal Name
Energies
Volume
16
Issue
7
First Page
3216
Year
2023
Publication Date
2023-04-03
ISSN
1996-1073
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Original Submission
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PII: en16073216, Publication Type: Journal Article
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LAPSE:2023.30954
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https://doi.org/10.3390/en16073216
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