LAPSE:2023.22519v1
Published Article

LAPSE:2023.22519v1
Space Charge Accumulation at Material Interfaces in HVDC Cable Insulation Part II—Simulations of Charge Transport
March 24, 2023
Abstract
Extruded high voltage direct current (HVDC) cable systems contain interfaces with poorly understood microscopic properties, particularly surface roughness. Modelling the effect of roughness on conduction in cable insulation is challenging, as the available results of macroscopic measurements give little information about microscopic charge distributions at material interfaces. In this work, macroscopic charge injection from interfaces is assessed by using a bipolar charge transport model, which is validated against a series of space charge measurements on cable peelings with different degrees of surface roughness. The electric field-dependent conduction and charge trapping effects stimulated by the injection current originating from rough surfaces are assessed. It is shown that by accounting for roughness enhanced charge injection with the parameters derived in part I of the paper, reasonable agreement between computed and measured results can be achieved at medium field strengths (10−40 kV/mm).
Extruded high voltage direct current (HVDC) cable systems contain interfaces with poorly understood microscopic properties, particularly surface roughness. Modelling the effect of roughness on conduction in cable insulation is challenging, as the available results of macroscopic measurements give little information about microscopic charge distributions at material interfaces. In this work, macroscopic charge injection from interfaces is assessed by using a bipolar charge transport model, which is validated against a series of space charge measurements on cable peelings with different degrees of surface roughness. The electric field-dependent conduction and charge trapping effects stimulated by the injection current originating from rough surfaces are assessed. It is shown that by accounting for roughness enhanced charge injection with the parameters derived in part I of the paper, reasonable agreement between computed and measured results can be achieved at medium field strengths (10−40 kV/mm).
Record ID
Keywords
bipolar charge transport, charge injection, charge packets, detrapping, electrical conduction, hopping, roughness enhanced charge injection, surface roughness, trapping
Subject
Suggested Citation
Doedens E, Jarvid EM, Guffond R, Serdyuk YV. Space Charge Accumulation at Material Interfaces in HVDC Cable Insulation Part II—Simulations of Charge Transport. (2023). LAPSE:2023.22519v1
Author Affiliations
Doedens E: Department of Electrical Engineering, Chalmers University of Technology, SE-41258 Gothenburg, Sweden; Nexans Norway AS, 70 Knivsøveien, NO-1788 Halden, Norway
Jarvid EM: Nexans Norway AS, 70 Knivsøveien, NO-1788 Halden, Norway
Guffond R: Nexans Research Centre (NRC), 69007 Lyon, France
Serdyuk YV: Department of Electrical Engineering, Chalmers University of Technology, SE-41258 Gothenburg, Sweden [ORCID]
Jarvid EM: Nexans Norway AS, 70 Knivsøveien, NO-1788 Halden, Norway
Guffond R: Nexans Research Centre (NRC), 69007 Lyon, France
Serdyuk YV: Department of Electrical Engineering, Chalmers University of Technology, SE-41258 Gothenburg, Sweden [ORCID]
Journal Name
Energies
Volume
13
Issue
7
Article Number
E1750
Year
2020
Publication Date
2020-04-06
ISSN
1996-1073
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Original Submission
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PII: en13071750, Publication Type: Journal Article
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LAPSE:2023.22519v1
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https://doi.org/10.3390/en13071750
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Mar 24, 2023
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