The working life of a stack is basically determined by the behavior of its weakest monomer; therefore, during a dynamic loading process, high-voltage uniformity plays a key role in stack durability. This work experimentally investigated dynamic responses and voltage uniformity with different loading strategies from an initial state (open-circuit state) to a target current at subzero temperatures. The results presented that the maximum voltage coefficient variation Cv values, representing the relative standard deviation of the monomer voltage, increased from 19.75 to 35.65 and the voltage uniformity sharply decreased with the increase in loading sizes at the stack temperature of −4 °C. It was possible that this could result in the instability of the single cell voltage output and a voltage uniformity fluctuation with a high step loading amplitude. The voltage uniformity became worse as the stack temperature decreased from −2 °C to −8 °C, the voltage uniformity between single cells of the stack continued to deteriorate under a step current density of 0.15 A/cm2 at a relatively low temperature of −8 °C. By comparing several constant loading rate strategies, it could be ascertained that reducing the loading rate was conducive to voltage uniformity in the whole investigated process. A comparison of the different loading rates indicated that the square increasing loading rate strategy is the best strategy among them and a Cv threshold of 5.5 can be obtained during the whole load process at a temperature of −4 °C, which might be a guideline and provide a reference in actual engineering applications for PEMFC dynamic loading responses.