ISSN: 2818-4734Volume: 3 (2024)
LAPSE:2024.1526
Published Article
LAPSE:2024.1526
Cybersecurity, Image-Based Control, and Process Design and Instrumentation Selection
August 15, 2024. Originally submitted on July 9, 2024
Within an Industry 4.0 framework, a variety of new considerations are of increasing importance, such as securing processes against cyberattacks on the control systems or utilizing advances in image processing for image-based control. These new technologies impact relationships between process design and control. In this work, we discuss some of these potential relationships, beginning with a discussion of side channel attacks and what they suggest about ways of evaluating plant design and instrumentation selection, along with controller and security schemes, particularly as more data is collected and there is a move toward an industrial Internet of Things. Next, we highlight how the 3D computer graphics software tool set Blender can be utilized to analyze a variety of considerations related to ensuring safety of plant operation and facilitating the design of assemblies with image-based sensing.
Record ID
Keywords
Cybersecurity, Dynamic Modelling, Image-Based Control, Industry 40, Instrumentation, Nonlinear Model Predictive Control, Simulation
Subject
Suggested Citation
Messina D, Leonard AF, Hightower R, Nieman K, ONeill R, Beacham P, Tyrrell K, Adnan M, Durand H. Cybersecurity, Image-Based Control, and Process Design and Instrumentation Selection. Systems and Control Transactions 3:186-193 (2024) https://doi.org/10.69997/sct.182710
Author Affiliations
Messina D: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Leonard AF: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Hightower R: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Nieman K: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
ONeill R: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Beacham P: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Tyrrell K: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Adnan M: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Durand H: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Leonard AF: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Hightower R: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Nieman K: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
ONeill R: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Beacham P: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Tyrrell K: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Adnan M: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Durand H: Wayne State University, Department of Chemical Engineering and Materials Science, Detroit, Michigan, USA
Journal Name
Systems and Control Transactions
Volume
3
First Page
186
Last Page
193
Year
2024
Publication Date
2024-07-10
Version Comments
DOI Assigned
Other Meta
PII: 0186-0193-676329-SCT-3-2024, Publication Type: Journal Article
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Published Article
LAPSE:2024.1526
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External Link
https://doi.org/10.69997/sct.182710
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